DGE will work with your requirements to develop a quality data acquisition solution.

As an example, this Data Acquisition System (DAS) utilizes a PXI rack architecture and Labview/Windows GUI.  It features custom signal conditioning to match customer applications provided through a small plug in circuit board.  The DAS may be used as an EMC tester, bench top simulator, or functional tester. User inputs for expected values and tolerances are made in a simple Excel spreadsheet.

Features include:

• 192 digital I/O
• 16 analog I/O
• Arbitrary waveform generator
• 2 CAN ports
• Ethernet
• Timing signal display

Our data acquisition systems are capable of generating and capturing high speed digital signals, including frequency, pulse width, and duty cycle.  The system will create data log files consisting of expected values, baseline values, actual test values, tolerances and failure status in a standard csv format.

For further information, see our Data Acquisition System data sheet or read our DAS solution article/case study at the National Instruments website.  We are a member of the PXI Systems Alliance.

Please contact us if you'd like us to quote a custom data acquisiton system.